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2 Results:SS:INTEGRATEDCIRCUIT PP:CARNEGIE MELLON UNIVERSITY. 0.296 sec.
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1
Measuring Security Metrics of Locked Circuits with Test.
Measuring Security Metrics of Locked Circuits with Test.
Duvalsaint, Danielle.Electrical and Computer Engin | Carnegie Mellon University. | 2022
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2
Integrated Circuit Test Optimization for Comprehensive Defect Characterization.
Integrated Circuit Test Optimization for Comprehensive Defect Characterization.
Fang, Chenlei.Electrical and Computer Engineering. | Carnegie Mellon University. | 2021
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