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Design Technology Co-optimization of Energy-Efficient Digital Logic Using Carbon Nanotubes.
Design Technology Co-optimization of Energy-Efficient Digital Logic Using Carbon Nanotubes.
상세정보
- 자료유형
- 학위논문
- Control Number
- 0017161493
- International Standard Book Number
- 9798382232478
- Dewey Decimal Classification Number
- 620.11
- Main Entry-Personal Name
- Carlo Gilardi.
- Publication, Distribution, etc. (Imprint
- [S.l.] : Stanford University., 2024
- Publication, Distribution, etc. (Imprint
- Ann Arbor : ProQuest Dissertations & Theses, 2024
- Physical Description
- 136 p.
- General Note
- Source: Dissertations Abstracts International, Volume: 85-11, Section: B.
- General Note
- Advisor: Subhasish Mitra.
- Dissertation Note
- Thesis (Ph.D.)--Stanford University, 2024.
- Summary, Etc.
- 요약Carbon Nanotube field-effect transistors (FETs) are promising candidates for high-speed and low- energy digital logic, Carbon Nanotube FETs have been integrated within multiple industrial fabrication facilities at mature technology nodes (e.g., 90/130nm on 200mm silicon wafers). However, understanding Carbon Nanotube FET energy and delay benefits at extremely scaled nodes (e.g., beyond 2nm) is difficult due to several reasons:1. Carbon Nanotube FETs have distinct characteristics material properties and fabrication techniques versus silicon FETs, that directly impact digital logic energy and delay.2. Carbon Nanotube FET energy efficiency analysis must include Carbon Nanotube FET mini- mum leakage current.3. Carbon Nanotube FET digital logic energy and delay exhibit numerous trade-offs, far beyond those for silicon FETs.I address these challenges through new physics-based models using physically meaningful parameters, new Carbon Nanotube FET doping and layout design techniques, and extensive Design Technology Co-Optimization.To illustrate new physics-based models, I present the extended scale length theory. It captures the differences between Carbon Nanotube FET and silicon FET electrostatics that are crucial for energy and delay estimation. The extended scale length theory is also used as a mathematical framework for the development of a leakage model that includes the leakage mechanisms relevant for Carbon Nanotube FETs at extremely scaled nodes (e.g., inelastic band-to-band tunneling). The leakage model is used to quantify Carbon Nanotube FET minimum leakage current within 3x vs. experimentally calibrated Non-Equilibrium Green's Function (NEGF) solvers. In contrast, prior models that do not include all the relevant leakage mechanisms can underestimate Carbon Nanotube FET minimum leakage current by a factor of 105.Understanding Carbon Nanotube FET digital logic energy and delay trade-offs requires extensive Design Technology Co-Optimization simulations across many design and technology parameters. My new physics-based models enable fast Design Technology Co-Optimization: over 350,000 simulations in a few days vs. several months using existing Technology CAD simulators. Such extensive Design Technology Co-Optimization helps derive Carbon Nanotube FET design and technology parameters with up to 7x projected Energy-Delay Product (EDP) benefits vs. silicon FETs at the 2nm technology node. These Design Technology Co-Optimization simulations also include a new Carbon Nanotube FET extension doping technique based on the concept of a barrier booster.A new logic layout technique called Omni 3D exploits Carbon Nanotube FET low-temperature fabrication to further enable up to 1.9x additional projected EDP benefits. Several of my thesis contributions extend beyond Carbon Nanotube FETs, e.g., to FETs based on two-dimensional materials.
- Subject Added Entry-Topical Term
- Materials science.
- Subject Added Entry-Topical Term
- Energy.
- Subject Added Entry-Topical Term
- Electrical engineering.
- Index Term-Uncontrolled
- Carbon Nanotube field-effect transistors
- Index Term-Uncontrolled
- Fabrication techniques
- Added Entry-Corporate Name
- Stanford University.
- Host Item Entry
- Dissertations Abstracts International. 85-11B.
- Electronic Location and Access
- 로그인을 한후 보실 수 있는 자료입니다.
- Control Number
- joongbu:657717
MARC
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■040 ▼aMiAaPQ▼cMiAaPQ
■0820 ▼a620.11
■1001 ▼aCarlo Gilardi.
■24510▼aDesign Technology Co-optimization of Energy-Efficient Digital Logic Using Carbon Nanotubes.
■260 ▼a[S.l.]▼bStanford University. ▼c2024
■260 1▼aAnn Arbor▼bProQuest Dissertations & Theses▼c2024
■300 ▼a136 p.
■500 ▼aSource: Dissertations Abstracts International, Volume: 85-11, Section: B.
■500 ▼aAdvisor: Subhasish Mitra.
■5021 ▼aThesis (Ph.D.)--Stanford University, 2024.
■520 ▼aCarbon Nanotube field-effect transistors (FETs) are promising candidates for high-speed and low- energy digital logic, Carbon Nanotube FETs have been integrated within multiple industrial fabrication facilities at mature technology nodes (e.g., 90/130nm on 200mm silicon wafers). However, understanding Carbon Nanotube FET energy and delay benefits at extremely scaled nodes (e.g., beyond 2nm) is difficult due to several reasons:1. Carbon Nanotube FETs have distinct characteristics material properties and fabrication techniques versus silicon FETs, that directly impact digital logic energy and delay.2. Carbon Nanotube FET energy efficiency analysis must include Carbon Nanotube FET mini- mum leakage current.3. Carbon Nanotube FET digital logic energy and delay exhibit numerous trade-offs, far beyond those for silicon FETs.I address these challenges through new physics-based models using physically meaningful parameters, new Carbon Nanotube FET doping and layout design techniques, and extensive Design Technology Co-Optimization.To illustrate new physics-based models, I present the extended scale length theory. It captures the differences between Carbon Nanotube FET and silicon FET electrostatics that are crucial for energy and delay estimation. The extended scale length theory is also used as a mathematical framework for the development of a leakage model that includes the leakage mechanisms relevant for Carbon Nanotube FETs at extremely scaled nodes (e.g., inelastic band-to-band tunneling). The leakage model is used to quantify Carbon Nanotube FET minimum leakage current within 3x vs. experimentally calibrated Non-Equilibrium Green's Function (NEGF) solvers. In contrast, prior models that do not include all the relevant leakage mechanisms can underestimate Carbon Nanotube FET minimum leakage current by a factor of 105.Understanding Carbon Nanotube FET digital logic energy and delay trade-offs requires extensive Design Technology Co-Optimization simulations across many design and technology parameters. My new physics-based models enable fast Design Technology Co-Optimization: over 350,000 simulations in a few days vs. several months using existing Technology CAD simulators. Such extensive Design Technology Co-Optimization helps derive Carbon Nanotube FET design and technology parameters with up to 7x projected Energy-Delay Product (EDP) benefits vs. silicon FETs at the 2nm technology node. These Design Technology Co-Optimization simulations also include a new Carbon Nanotube FET extension doping technique based on the concept of a barrier booster.A new logic layout technique called Omni 3D exploits Carbon Nanotube FET low-temperature fabrication to further enable up to 1.9x additional projected EDP benefits. Several of my thesis contributions extend beyond Carbon Nanotube FETs, e.g., to FETs based on two-dimensional materials.
■590 ▼aSchool code: 0212.
■650 4▼aMaterials science.
■650 4▼aEnergy.
■650 4▼aElectrical engineering.
■653 ▼aCarbon Nanotube field-effect transistors
■653 ▼aFabrication techniques
■690 ▼a0544
■690 ▼a0794
■690 ▼a0791
■71020▼aStanford University.
■7730 ▼tDissertations Abstracts International▼g85-11B.
■790 ▼a0212
■791 ▼aPh.D.
■792 ▼a2024
■793 ▼aEnglish
■85640▼uhttp://www.riss.kr/pdu/ddodLink.do?id=T17161493▼nKERIS▼z이 자료의 원문은 한국교육학술정보원에서 제공합니다.