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Self-heating Effect Alleviation for Post-Moore era Channel Materials- [electronic resource]
ข้อมูลเนื้อหา
Self-heating Effect Alleviation for Post-Moore era Channel Materials- [electronic resource]
자료유형  
 학위논문
Control Number  
0016932812
International Standard Book Number  
9798379845780
Dewey Decimal Classification Number  
620
Main Entry-Personal Name  
Liao, Pai-Ying.
Publication, Distribution, etc. (Imprint  
[S.l.] : Purdue University., 2022
Publication, Distribution, etc. (Imprint  
Ann Arbor : ProQuest Dissertations & Theses, 2022
Physical Description  
1 online resource(138 p.)
General Note  
Source: Dissertations Abstracts International, Volume: 85-01, Section: B.
General Note  
Advisor: Ye, Peide D.
Dissertation Note  
Thesis (Ph.D.)--Purdue University, 2022.
Restrictions on Access Note  
This item must not be sold to any third party vendors.
Summary, Etc.  
요약As the miniaturization of the transistors in integrated circuits approaches the atomic scale limit, novel materials with exceptional performance are desired. Moreover, to conduct enough current with an ultrathin and small-scale body, high drain current density is preferably required. Nevertheless, devices may suffer seriously from self-heating effect (SHE) with high drain bias and current if the generated heat cannot be dissipated efficiently. In this thesis, we introduce two material systems and several techniques to accomplish the demand without SHE. Tellurium, as a van der Waals material composed by atomic helical chains, is able to realize its one-dimensional structure. We illustrate that the cross-sectional current density of 150 MA/cm2 is achieved through boron nitride nanotube (BNNT) encapsulation without SHE due to the superior thermal conductivity of BN. With the nanotube encapsulation technique applied, one-dimensional tellurium nanowire transistors with diameter down to 2 nm are realized as well, and single tellurium atomic chain is isolated. Furthermore, atomic-layer-deposited indium oxide (In2O3) as thin-film transistors exhibit even better current carrying capacity. Through co-optimization of their electrical and thermal performance, drain current up to 4.3 mA/μm is achieved with a 1.9-nm-thick body without SHE. The alleviation of SHE is due to a) the high thermal conductivity of the substrate assisting on efficiently dissipating the generated thermal energy, b) SHE avoidance with short-pulse measurement, and c) interface engineering between the channel stack and the substrate. These two material systems may be the solid solution to the desire of high current density transistors in the post-Moore era.
Subject Added Entry-Topical Term  
Silicon.
Subject Added Entry-Topical Term  
Crystal structure.
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Boron.
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Phosphorus.
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Integrated circuits.
Subject Added Entry-Topical Term  
Cadmium telluride.
Subject Added Entry-Topical Term  
Thermal energy.
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Nanowires.
Subject Added Entry-Topical Term  
Spectrum analysis.
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Lasers.
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Power.
Subject Added Entry-Topical Term  
Carbon.
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Molybdenum.
Subject Added Entry-Topical Term  
Chemical vapor deposition.
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Selenium.
Subject Added Entry-Topical Term  
Chemical bonds.
Subject Added Entry-Topical Term  
Indium.
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Magnesium.
Subject Added Entry-Topical Term  
Physical properties.
Subject Added Entry-Topical Term  
Heat conductivity.
Subject Added Entry-Topical Term  
Visualization.
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Thin films.
Subject Added Entry-Topical Term  
Annealing.
Subject Added Entry-Topical Term  
Analytical chemistry.
Subject Added Entry-Topical Term  
Chemistry.
Subject Added Entry-Topical Term  
Condensed matter physics.
Subject Added Entry-Topical Term  
Electrical engineering.
Subject Added Entry-Topical Term  
Energy.
Subject Added Entry-Topical Term  
Materials science.
Subject Added Entry-Topical Term  
Nanotechnology.
Subject Added Entry-Topical Term  
Optics.
Subject Added Entry-Topical Term  
Physics.
Subject Added Entry-Topical Term  
Thermodynamics.
Added Entry-Corporate Name  
Purdue University.
Host Item Entry  
Dissertations Abstracts International. 85-01B.
Host Item Entry  
Dissertation Abstract International
Electronic Location and Access  
로그인을 한후 보실 수 있는 자료입니다.
Control Number  
joongbu:643779
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