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Reliability Studies in Silicon Carbide and Silicon Power Mosfets.
Reliability Studies in Silicon Carbide and Silicon Power Mosfets.
- 자료유형
- 학위논문
- Control Number
- 0016618676
- International Standard Book Number
- 9798841572107
- Dewey Decimal Classification Number
- 620
- Main Entry-Personal Name
- Ghosh, Amartya Kumar.
- Publication, Distribution, etc. (Imprint
- [S.l.] : The Pennsylvania State University., 2022
- Publication, Distribution, etc. (Imprint
- Ann Arbor : ProQuest Dissertations & Theses, 2022
- Physical Description
- 124 p.
- General Note
- Source: Dissertations Abstracts International, Volume: 84-02, Section: B.
- General Note
- Advisor: Awadelkarim, Osama O. .
- Dissertation Note
- Thesis (Ph.D.)--The Pennsylvania State University, 2022.
- Restrictions on Access Note
- This item must not be sold to any third party vendors.
- Subject Added Entry-Topical Term
- Receivers & amplifiers.
- Subject Added Entry-Topical Term
- Disadvantages.
- Subject Added Entry-Topical Term
- Physics.
- Subject Added Entry-Topical Term
- Silicon carbide.
- Subject Added Entry-Topical Term
- Electrodes.
- Subject Added Entry-Topical Term
- Oxidation.
- Subject Added Entry-Topical Term
- Semiconductors.
- Subject Added Entry-Topical Term
- Electric fields.
- Subject Added Entry-Topical Term
- Circuits.
- Subject Added Entry-Topical Term
- Diffusion.
- Subject Added Entry-Topical Term
- Transistors.
- Subject Added Entry-Topical Term
- Electrical engineering.
- Subject Added Entry-Topical Term
- Engineering.
- Added Entry-Corporate Name
- The Pennsylvania State University.
- Host Item Entry
- Dissertations Abstracts International. 84-02B.
- Host Item Entry
- Dissertation Abstract International
- Electronic Location and Access
- 로그인을 한후 보실 수 있는 자료입니다.
- Control Number
- joongbu:624670
Buch Status
- Reservierung
- 캠퍼스간 도서대출
- 서가에 없는 책 신고
- Meine Mappe