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In situ transmission electron microscopy characterization of nanomaterials
In situ transmission electron microscopy characterization of nanomaterials
- 자료유형
- 학위논문
- Dewey Decimal Classification Number
- 620.1107-20
- Main Entry-Personal Name
- Lee, Joon Hwan
- Publication, Distribution, etc. (Imprint
- Ann Arbor : ProQuest, 2012.
- Physical Description
- xviii, 208 p. : chart, photo ; 23 cm.
- Dissertation Note
- Ph.D - Texas A&M University : Materials Science and Engineering, 2012
- Bibliography, Etc. Note
- Reference : p.192 ~ 208
- Control Number
- joongbu:495896
