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Electrothermal analysis of VLSI systems- [electronic resource]
Electrothermal analysis of VLSI systems- [electronic resource]
상세정보
- 자료유형
- 단행본
- Control Number
- 0008537669
- International Standard Book Number
- 0306470241 (electronic bk.)
- Dewey Decimal Classification Number
- 621.39/5-21
- Main Entry-Corporate Name
- NetLibrary, Inc.
- Publication, Distribution, etc. (Imprint
- New York : Kluwer Academic Publishers, c2002.
- Physical Description
- xviii, 210 p : ill.
- Bibliography, Etc. Note
- Includes bibliographical references and index.
- Reproduction Note
- Electronic reproduction. . Boulder, Colo. : NetLibrary, 2002. Available via World Wide Web. Access may be limited to NetLibrary affiliated libraries.
- Subject Added Entry-Topical Term
- Integrated circuits Very large scale integration Mathematical models
- Subject Added Entry-Topical Term
- Semiconductors Thermal properties Mathematical models
- Subject Added Entry-Topical Term
- Thermal analysis Data processing
- Subject Added Entry-Topical Term
- Metal oxide semiconductors Mathematical models
- Subject Added Entry-Topical Term
- Metal oxide semiconductors, Complementary Mathematical models
- Added Entry-Personal Name
- Cheng, Yi-Kan , 1968-
- Additional Physical Form Entry
- . Original. 079237861X. (DLC) 00030175
- Electronic Location and Access
- 로그인을 한후 보실 수 있는 자료입니다.
- Control Number
- joongbu:102893
MARC
008030520s2002 nyua sb 001 0 eng d■001000008537669
■003OCoLC
■00520030109194759.0
■006m u
■007cr cn---------
■020 ▼a0306470241 (electronic bk.)
■040 ▼aN$T▼cN$T▼dOCLCQ
■08204▼a621.39/5▼221
■090 ▼a621.39▼bN469e
■1102 ▼aNetLibrary, Inc.
■24500▼aElectrothermal analysis of VLSI systems▼h[electronic resource]▼cYi-Kan Cheng ... [et al.]
■260 ▼aNew York▼bKluwer Academic Publishers▼cc2002.
■300 ▼axviii, 210 p▼bill.
■504 ▼aIncludes bibliographical references and index.
■533 ▼aElectronic reproduction.▼bBoulder, Colo.▼cNetLibrary▼d2002.▼nAvailable via World Wide Web.▼nAccess may be limited to NetLibrary affiliated libraries.
■650 0▼aIntegrated circuits▼xVery large scale integration▼xMathematical models
■650 0▼aSemiconductors▼xThermal properties▼xMathematical models
■650 0▼aThermal analysis▼xData processing
■650 0▼aMetal oxide semiconductors▼xMathematical models
■650 0▼aMetal oxide semiconductors, Complementary▼xMathematical models
■655 7▼aElectronic books.▼2local
■7001 ▼aCheng, Yi-Kan▼d1968-
■7761 ▼cOriginal▼z079237861X▼w(DLC) 00030175
■8561 ▼uhttp://www.netLibrary.com/urlapi.asp?action=summary&v=1&bookid=66693▼zAn electronic book accessible through the World Wide Web; click for information
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